| 词条 | 纳米薄膜分析基础17 |
| 释义 | 图书信息出版社: 科学出版社; 第1版 (2008年6月1日) 外文书名: Fundamentals of Nanoscale Film Analysis 丛书名: 国外物理名著系列 精装: 336页 正文语种: 英语 开本: 32 ISBN: 7030222598, 9787030222596 条形码: 9787030222596 尺寸: 24 x 17.4 x 2.6 cm 重量: 662 g 作者简介作者：(美国)阿尔弗德(T.J.Alford) 内容简介《纳米薄膜分析基础17(影印版)》讨论了通过入射光子或粒子刻蚀纳米材料来表征材料的方法，入射的粒子能够激发出可测的粒子或光子，这正是表征材料的依据，纳米尺度材料分析实验会用到大量入射粒子与待测粒子束的相互作用。其中较重要的有原子碰撞、卢瑟福背散射、离子遂道、衍射、光子吸收、辐射与非辐射阳县跃迁以及核反应。《纳米薄膜分析基础17(影印版)》详细介绍了各种分析和扫描探针显微技术。 现代科学技术（从材料科学到集成电路）已深入到纳米层次。从薄膜到场效应传感器，研究的重点是如何把尺度从微米量级减小到纳米量级。纳米薄膜分析一书主要研究了材料表面及从表面到几十乃至100纳米深的结构与构成。主要讨论了用入射粒子和光子来量化结构并进行成分和深度分析的材料表征方法。 目录Preface 1. An Overview：Concepts，Units，and the Bohr Atom 1.1 Introduction 1.2 Nomenclature 1.3 Energies，Units，and Particles 1.4 Particle-Wave Duality and Lattice Spacing 1.5 The Bohr Model Problems 2. Atomic Collisions and Backscattering Spectrometry 2.1 Introduction 2.2 Kinematics of Elastic Collisions 2.3 Rutherford Backscattering Spectrometry 2.4 Scattering Cross Section and Impact Parameter 2.5 Central Force Scattering 2.6 Scattering Cross Section：Two-Body 2.7 Deviations from Rutherford Scattering at Low and High Energy 2.8 Low-Energy Ion Scattering 2.9 Forward Recoil Spectrometry 2.10 Center of Mass to Laboratory Transformation Problems 3. Energy Loss of Light Ions and Backscattering Depth Profiles 3.1 Introduction 3.2 General Picture of Energy Loss and Units of Energy Loss 3.3 Energy Loss of MeV Light Ions in Solids 3.4 Energy Loss in Compounds Bragg's Rule 3.5 The Energy Width in Backscattering 3.6 The Shape of the Backscattering Spectrum 3.7 Depth Profiles with Rutherford Scattering 3.8 Depth Resolution and Energy-Loss Straggling 3.9 Hydrogen and Deuterium Depth Profiles 3.10 Ranges of H and He Ions 3.11 Sputtering and Limits to Sensitivity 3.12 Summary of Scattering Relations Problems 4. Sputter Depth Profiles and Secondary Ion Mass Spectroscopy 4.1 Introduction 4.2 Sputtering by Ion Bombardment-General Concepts 4.3 Nuclear Energy Loss 4.4 Sputtering Yield 4.5 Secondary Ion Mass Spectroscopy (SIMS) 4.6 Secondary Neutral Mass Spectroscopy (SNMS) 4.7 Preferential Sputtering and Depth Profiles 4.8 Interface Broadening and Ion Mixing 4.9 Thomas-Fermi Statistical Model of the Atom Problems 5. Ion Channeling 5.1 Introduction 5.2 Channeling in Single Crystals 5.3 Lattice Location of Impurities in Crystals 5.4 Channeling Flux Distributions 89 5.5 Surface Interaction via a Two-Atom Model 5.6 The Surface Peak 5.7 Substrate Shadowing：Epitaxial Au on Ag(111) 5.8 Epitaxial Growth 5.9 Thin Film Analysis Problems 6. Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies 6.1 Introduction 6.2 Electron Spectroscopies：Energy Analysis 6.3 Escape Depth and Detected Volume 6.4 Inelastic Electron-Electron Collisions 6.5 Electron Impact Ionization Cross Section 6.6 Plasmons 6.7 The Electron Mean Free Path 6.8 Influence of Thin Film Morphology on Electron Attenuation 6.9 Range of Electrons in Solids 6.10 Electron Energy Loss Spectroscopy (EELS) 6.11 Bremsstrahlung Problems 7. X-ray Diffraction 7.1 Introduction 7.2 Bragg's Law in Real Space 7.3 Coefficient of Thermal Expansion Measurements 7.4 Texture Measurements in Polycrystalline Thin Films 7.5 Strain Measurements in Epitaxial Layers 7.6 Crystalline Structure 7.7 Allowed Reflections and Relative Intensities Problems 8. Electron Diffraction 8.1 Introduction 8.2 Reciprocal Space 8.3 Laue Equations 8.4 Bragg's Law 8.5 Ewald Sphere Synthesis 8.6 The Electron Microscope 8.7 Indexing Diffraction Patterns Problems 9. Photon Absorption in Solids and EXAFS 9.1 Introduction 9.2 The Schrodinger Equation 9.3 Wave Functions 9.4 Quantum Numbers，Electron Configuration,and Notation 9.5 Transition Probability 9.6 Photoelectric Effect Square-Well Approximation 9.7 Photoelectric Transition Probability for a Hydrogenic Atom 9.8 X-ray Absorption 9.9 Extended X-ray Absorption Fine Structure (EXAFS) 9.10 Time-Dependent Perturbation Theory Problems 10. X-ray Photoelectron Spectroscopy 10.1 Introduction 10.2 Experimental Considerations 10.3 Kinetic Energy of Photoelectrons 10.4 Photoelectron Energy Spectrum 10.5 Binding Energy and Final-State Effects 10.6 Binding Energy Shifts-Chemical Shifts 10.7 Quantitative Analysis Problems 11. Radiative Transitions and the Electron Microprobe 11.1 Introduction 11.2 Nomenclature in X-Ray Spectroscopy 11.3 Dipole Selection Rules 11.4 Electron Microprobe 11.5 Transition Rate for Spontaneous Emission 11.6 Transition Rate for K Emission in Ni 11.7 Electron Microprobe：Quantitative Analysis 11.8 Particle-Induced X-Ray Emission (PIXE) 11.9 Evaluation of the Transition Probability for Radiative Transitions 11.10 Calculation of the K /K Ratio Problems 12. Nonradiative Transitions and Auger Electron Spectroscopy 12.1 Introduction 12.2 Auger Transitions 12.3 Yield of Auger Electrons and Fluorescence Yield 12.4 Atomic Level Width and Lifetimes 12.5 Auger Electron Spectroscopy 12.6 Quantitative Analysis 12.7 Auger Depth Profiles Problems 13. Nuclear Techniques：Activation Analysis and Prompt Radiation Analysis 13.1 Introduction 13.2 Q Values and Kinetic Energies 13.3 Radioactive Decay 13.4 Radioactive Decay Law 13.5 Radionuclide Production 13.6 Activation Analysis 13.7 Prompt Radiation Analysis Problems 14. Scanning Probe Microscopy 14.1 Introduction 14.2 Scanning Tunneling Microscopy 14.3 Atomic Force Microscopy Appendix 1. Km for 4He+ as Projectile and Integer Target Mass Appendix 2. Rutherford Scattering Cross Section of the Elements for 1 MeV4Hei Appendix 3. 4He+ Stopping Cross Sections Appendix 4. Electron Configurations and Ionization Potentials of Atoms Appendix 5. Atomic Scattering Factors Appendix 6. Electron Binding Energies Appendix 7. X-Ray Wavelengths (nm) Appendix 8. Mass Absorption Coefficient and Densities Appendix 9. KLL Auger Energies (eV) Appendix 10. Table of the Elements Appendix 11. Table of Fluoresence Yields for K，L，and M Shells Appendix 12. Physical Constants，Conversions，and Useful Combinations Appendix 13. Acronyms Index |
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